'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
DOI:10.1109/TMAG.2005.855201
Abstract
The magnetic moments of ultrathin Fe films on three different III-V semiconductor substrates, namely GaAs, InAs and In0.2Ga0.8As have been measured with X-ray magnetic circular dichroism at room temperature to assess their relative merits as combinations suitable for next-generation spintronic devices. The results revealed rather similar spin moments and orbital moments for the three systems, suggesting the relationship between film and semiconductor lattice parameters to be less critical to magnetic moments than magnetic anisotropy
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