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RASOR : an advanced instrument for soft x-ray reflectivity and diffraction. \ud

By T.A.W. Beale, T.P.A. Hase, T. Iida, K. Endo, P. Steadman, A.R. Marshall, S.S. Dhesi, G. van der Laan and P.D. Hatton


We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (θ, 2θ, and χ) diffractometer with an additional removable rotation (ϕ) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument.\u

Topics: Cryostats, X-ray diffractometeres, X-ray reflection, Resonant magnetic scattering, Active pixel sensor, Exchange Scattering, Bragg-diffractio, Multilayers, Anisotropy, Edges, Films, Iron.
Publisher: American Institute of Physics
Year: 2010
DOI identifier: 10.1063/1.3458004
OAI identifier:

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