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Quantitative analysis of the critical current due to vortex pinning by surface corrugation.

By Alain Pautrat, J. Scola, C. Goupil, Ch. Simon, C. Villard, B. Domengès, Y. Simon, Ch. Guilpin and Laurence Méchin

Abstract

accepted for publication in Phys Rev BThe transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by the spectral analysis of the surface roughness. Increasing the surface roughness using a Focused Ion Beam results also in an increase of the superficial critical current

Topics: 74.60.Ec, 74.60.Ge, 61.12.Ex, 74.70.Ad., [PHYS.COND.CM-S] Physics [physics]/Condensed Matter [cond-mat]/Superconductivity [cond-mat.supr-con]
Publisher: HAL CCSD
Year: 2004
OAI identifier: oai:HAL:hal-00001451v1
Provided by: Hal-Diderot
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