Microstructure of Monolithic DyBa2Cu3O7-x Coated Conductor Thick Films

Abstract

AbstractFive μm thick DyBa2Cu3O7-x (DyBCO) films were deposited via Inclined Substrate Deposition (ISD) on Hastelloy substrates. A critical current density of 2.0 MA cm-2 was measured resistively at 77K and self-field yielding 1000 A cm-1. A grain size of 500-600nm was determined and only small-angle grain boundaries were observed. The DyBCO film is highly biaxially textured and the c-axis encloses an angle of 27±1̊ with the substrate normal over the complete film thickness. A perfect growth behavior of DyBCO in ISD technology was observed due to the faceted structure of the MgO surface yielding a non-zero component of the growth direction parallel to the (a,b)-plane of the DyBCO