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Extraction and analysis of microcrater residues using focused ion beam microscopy

By J.C. Bridges, I.A. Franchi and S.F. Green


We describe results from a new technique using dual beam FIB/SEM with which impact residues can be extracted from microcraters and analysed by EDS. This will allow the determination of residue compositions from Stardust craters

Year: 2006
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Provided by: Open Research Online

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