Density Determination and Analysis of Porous Anodic Aluminum Surfaces Using MeV Ion Beams


Densities of porous anodic a luminum oxide coatings have been measured to range from 1.1 to 2.2 g/cm 8, values approximately 0.3-0.6 times those of bulk A1208. These measurements are obtained by using two independent techniques for determining film parameters, Rutherford backscatter (RBS) of MeV protons and alpha particles and optical or scanning Auger microscopy. The former gives areal densities in units of g/cm 2 and the latter two thick-nesses in units of cm. Addit ional information on the composition of the films studied using ion- induced x- ray analysis s imultaneously with RBS is: (i) the compositions are mainly A120 ~ with small amounts of SOa or CrO ~ for those anodic layers grown in H2SO ~ or H2CrO4 electrolytes, respectively; (ii) sulfur is present as a contaminant in layers grown in H2CrO4 electrolytes; (iii) there is a reduction in the concentration of the al loying elements in an-odized films grown on 7075 T-73 A1; (iv) atoms from the cathode are de-posited on the film surfaces during anodization; (v) chlorine is presen

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