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Growth, morphological and structural characterization of silicon carbide epilayers for power electronic devices applications

By Candido Pirri, Samuele Porro, Sergio Ferrero, Edvige Celasco, Salvatore Antonio Guastella, Luciano Scaltrito, R. Yakimova, M. Syväjärvi, R.R. Ciechonski, S. De Angelis and D. Crippa
Publisher: John Wiley & Sons, Ltd.
Year: 2005
DOI identifier: 10.1002/crat.200410468
OAI identifier: oai:porto.polito.it:2588457
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