Growth, morphological and structural characterization of silicon carbide epilayers for power electronic devices applications

Pirri, Candido; Porro, Samuele; Ferrero, Sergio; Celasco, Edvige; Guastella, Salvatore Antonio; Scaltrito, Luciano; Yakimova, R.; Syväjärvi, M.; Ciechonski, R.R.; De Angelis, S.; Crippa, D.

oai:porto.polito.it:2588457

Growth, morphological and structural characterization of silicon carbide epilayers for power electronic devices applications

Authors: Candido Pirri
Samuele Porro
Sergio Ferrero
Edvige Celasco
Salvatore Antonio Guastella
Luciano Scaltrito
R. Yakimova
M. Syväjärvi
R.R. Ciechonski
S. De Angelis
D. Crippa
Publication date: 2005
Publisher: John Wiley & Sons, Ltd.
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oai:porto.polito.it:2588457

Last time updated on 16/02/2017

This paper was published in PORTO Publications Open Repository TOrino.

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