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Ultra thin film deposition of nickel, cobalt and nickel-cobalt and evaluation using scanning acoustic microscopy

By Annemarie Balutiu

Abstract

In the last few years, ultra-thin films have been widely adopted in medical and industrial applications; especially the dielectric implants coated with porous ultra thin films used in medical field. In the present investigation, a combination of two techniques was used: a classic one for the deposition of ultra thin films (i.e., electroless deposition) and a complementary non-destructive technique (i.e., scanning acoustic microscopy) for quality evaluation of nickel cobalt ultra thin films grown on a dielectric substrate. The developed method is useful for further improvement of designing and manufacturing of the films. In order to evaluate interface conditions with maximum sensitivity, high frequency (i.e., 600 MHz and 1 GHz) was employed. A highly focused ultrasonic beam emitted from a high numerical aperture enhanced contrast in the image. Therefore, the image showed minute details (i.e., porosity, micro-cracks, delaminations, detect poor adhesion at the interface), that other conventional microscopes have difficulty visualizing

Topics: scanning acoustic microscopy, Chemistry, Physical Sciences and Mathematics
Publisher: 'University of Windsor Leddy Library'
Year: 2007
OAI identifier: oai:scholar.uwindsor.ca:etd-6273

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