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Observation of fine one-dimensionally disordered layers in silicon carbide

By Paul Barnes, Jim Kelly and G.R. Chikusa

Abstract

The improved resolution of synchrotron edge-topography is enabling thinner (less than 100 microns), silicon carbide crystals to be studied, and is providing a more detailed and wider database on polytype depth profiles. Fine long-period and one-dimensionally-disordered layers, 5-25 microns thick, can now be confidently resolved and are found to be very common features, often in association with high-defect density bands. These features are illustrated in this paper using three examples. A new long period polytype LPP (152H/456R) has been discovered and reported here for the first time

Topics: bcs
Publisher: Taylor and Francis
Year: 1991
OAI identifier: oai:eprints.bbk.ac.uk.oai2:407

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