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A simulation of recrystallization based on EBSD orientation microscopy data

By O. Engler

Abstract

The present paper introduces a novel stochastic two-dimensional model to simulate the evolution of microstructure and texture during recrystallization. The model is based on data derived by automated large-scale EBSD local texture analysis, i.e., by orientation microscopy. Each measured point is characterized by its coordinates x and y in the microstructure, its crystallographic orientation g and a parameter q describing the quality of the EBSD-pattern which is affected by lattice strain and hence discloses information on the dislocation density. The concurrent information on the local arrangement of orientations and dislocation densities is utilized to derive conclusions on the nucleation and subsequent growth of the new recrystallized grains. The principles of the model are outlined and three example are shown to illustrate the possibilities of the model to simulate the evolution of microstructure and texture during recrystallization

Topics: Texture, Alloys, 36 Materials Science, Dislocations, Mathematical Models, Metals, Microstructure, Recrystallization
Publisher: Center for Materials Science (Los Alamos National Laboratory)
Year: 1998
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Provided by: UNT Digital Library
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