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Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths

By Jongsuck Bae, Tatsuya Okamoto, Tetsu Fujii, Koji Mizuno, Tatsuo Nozokido, ジョンソク ベイ and 鐘石 裵

Abstract

Scanning near-field optical microscopy using a slit-type probe is discussed. The slit-type probe has a width of much less than a wavelength, λ, and a length on the order of λ, and thus has high transmission efficiency. Two dimensional near-field images of objects have been constructed using an image reconstruction algorithm based on computerized tomographic imaging. Experiments performed at 60 GHz (λ = 5mm) show that this type of near-field microscopy can achieve a spatial resolution of better than λ/45 for two dimensional imaging. A method for fabricating a submicron width slit probe at the end of an optical fiber is presented for extending this microscopy to optical waves

Publisher: American Institute of Physics
Year: 1997
DOI identifier: 10.1063/1.120397
OAI identifier: oai:repo.lib.nitech.ac.jp:123456789/4058
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