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Numerical simulation of encapsulant curing within a variable frequency microwave processing system

By T. Tilford, K.I. Sinclair, G. Goussetis, C. Bailey, M.P.Y. Desmulliez, A.K. Parrott and A.J. Sangster

Abstract

Curing of encapsulant material in a simplified microelectronics package using an open oven Variable Frequency Microwave (VFM) system is numerically simulated using a coupled solver approach. A numerical framework capable of simulating electromagnetic field distribution within the oven system, plus heat transfer, cure rate, degree of cure and thermally induced stresses within the encapsulant material is presented. The discrete physical processes have been integrated into a fully coupled solution, enabling usefully accurate results to be generated. Numerical results showing the heating and curing of the encapsulant material have been obtained and are presented in this contribution. The requirement to capture inter-process coupling and the variation in dielectric and thermophysical material properties is discussed and illustrated with simulation results

Topics: TK
Publisher: Institute of Electrical and Electronics Engineers, Inc.
Year: 2008
OAI identifier: oai:gala.gre.ac.uk:1224
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