Electron scattering mechanisms within metallic multilayers are affected by both structural and magnetic disorders. Off-specular x-ray scattering has long been used to probe the structural interfaces, and it is only recently that it has been applied to the study of magnetic disorder. We compare the resonant magnetic x-ray scattering with off-specular neutron studies from magnetron-sputtered Co/Cu and Co/Ru multilayers grown at the second antiferromagnetic coupling peak. Both techniques yield similar results for the Cu system, and a simple domain model can be applied to extract the magnetic interface morphological parameters. For the Cu system, the in-plane correlation length is field dependent and is 880+/-20 Å after saturation along the hard axis, but increases to 7000+/-100 Å after saturation along the orthogonal easy axis. Both systems show strong out-of-plane correlations in both the structural and magnetic disorders. In all cases, the out-of-plane correlation length for the structural interfaces is 200-250 Å, but the ratio of the magnetic to structural correlations length is dependent on the magnitude of the exchange coupling and ranges from 0.4 to 1.4.