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Built-in self-test techniques using Boundary Scan Standard circuitry

By C.-H. Tsai

Abstract

[[fileno]]2030108030148[[department]]電機工程學

Topics: Built-in, self-test, circuitry, [[classification]]45
Publisher: Institute of Electrical and Electronics Engineers
Year: 2012
OAI identifier: oai:nthur.lib.nthu.edu.tw:987654321/68237
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