Skip to main content
Article thumbnail
Location of Repository

Tomographic imaging and scanning thermal microscopy: thermal impedance tomography

By R.H. [r.smallwood@shef.ac.uk] Smallwood, P. Metherall, D. Hose, M. Delves, H. Pollock, A. Hammiche, C. Hodges, V. Mathot and P. Willcocks

Abstract

The application of tomographic imaging techniques developed for medical applications to the data provided by the scanning thermal microscope will give access to true three-dimensional information on the thermal properties of materials on a mm length scale. In principle, the technique involves calculating and inverting a sensitivity matrix for a uniform isotropic material, collecting ordered data at several modulation frequencies, and multiplying the inverse of the matrix with the data vector. In practice, inversion of the matrix in impractical, and a novel iterative technique is used. Examples from both simulated and real data are given

Year: 2002
OAI identifier: oai:eprints.whiterose.ac.uk:423

Suggested articles


To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.