Skip to main content
Article thumbnail
Location of Repository

Systematic characterization of multi-crystalline silicon String Ribbon wafer

By C. Reimann, G. Müller, J. Friedrich, K. Lauer, A. Simonis, H. Wätzig, S. Krehan, R. Hartmann and A. Kruse

Abstract

The String Ribbon technology provides multi-crystalline silicon wafers for low cost and high efficiency solar cells (16% efficiency on untextured cells). This paper deals with the systematic characterization of standard String Ribbon wafer material produced by the Sovello AG. The investigations of the grain structure, the dislocation density (EPD), the minority carrier lifetime tau and the interstitial iron content Fe, show a clear correlation between lifetime, EPD, and interstitial iron concentration. High lifetime areas consist mainly of Sigma 3 twinned grains with low EPD and low interstitial iron content in the range of 4 x 10(11) atoms/cm(3). The dislocation and interstitial iron distribution is non-uniform over the ribbon width

Year: 2012
DOI identifier: 10.1016/j.jcrysgro.2012.08.022
OAI identifier: oai:fraunhofer.de:N-225368
Provided by: Fraunhofer-ePrints
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://publica.fraunhofer.de/d... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.