10.1149/05326.0001ecst

Inkjet-printed organic electronics: Operational stability and reliability issues

Abstract

The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time =1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water

Similar works

Full text

thumbnail-image

Fraunhofer-ePrints

Full text is not available
oai:fraunhofer.de:N-350665Last time updated on 11/15/2016

This paper was published in Fraunhofer-ePrints.

Having an issue?

Is data on this page outdated, violates copyrights or anything else? Report the problem now and we will take corresponding actions after reviewing your request.