NanoSPV - SPM Technique for the Quantitative Measurement of Minority Charge Carrier Diffusion Lengths with High Spatial Resolution: Presentation held at European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2014, September, 22. - 26., 2014, Amsterdam, The Netherlands

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oai:fraunhofer.de:N-322233Last time updated on 11/15/2016

This paper was published in Fraunhofer-ePrints.

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