NanoSPV - SPM Technique for the Quantitative Measurement of Minority Charge Carrier Diffusion Lengths with High Spatial Resolution: Presentation held at European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2014, September, 22. - 26., 2014, Amsterdam, The Netherlands


Abstract is not available.

Similar works

Full text



Full text is not available time updated on 11/15/2016

This paper was published in Fraunhofer-ePrints.

Having an issue?

Is data on this page outdated, violates copyrights or anything else? Report the problem now and we will take corresponding actions after reviewing your request.