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Uncoupled excitons in semiconductor microcavities detected in resonant Raman scattering

By R.M. Stevenson, V.N. Astratov, M.S. Skolnick, J.S. Roberts and G. Hill


We present an outgoing resonant Raman-scattering study of a GaAs/AlGaAs based microcavity embedded in a p-i-n junction. The p-i-n junction allows the vertical electric field to be varied, permitting control of exciton-photon detuning and quenching of photoluminescence which otherwise obscures the inelastic light scattering signals. Peaks corresponding to the upper and lower polariton branches are observed in the resonant Raman cross sections, along with a third peak at the energy of uncoupled excitons. This third peak, attributed to disorder activated Raman scattering, provides clear evidence for the existence of uncoupled exciton reservoir states in microcavities in the strong-coupling regime

Publisher: American Institute of Physics
Year: 2003
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