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Measuring and modeling of series resistance in submicron MOSFETs

By JAM Jan Otten
Topics: dissertations the and tu/e, semiconductors: electrical and magnetic properties, transistors (miscellaneous), materials science: dissertations, electrical engineering: dissertations, electrical resistivity, metal oxide semiconductors, mos-structures
Publisher: Technische Universiteit Eindhoven
Year: 1995
OAI identifier: oai:library.tue.nl:443996
Provided by: Repository TU/e
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