Article thumbnail

Measuring and modeling of series resistance in submicron MOSFETs

By JAM Jan Otten
Topics: dissertations the and tu/e, semiconductors: electrical and magnetic properties, transistors (miscellaneous), materials science: dissertations, electrical engineering: dissertations, electrical resistivity, metal oxide semiconductors, mos-structures
Publisher: Technische Universiteit Eindhoven
Year: 1995
OAI identifier:
Provided by: Repository TU/e
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • (external link)
  • Suggested articles

    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.