research
oaioai:eprints.whiterose.ac.uk:1846

XPS and XMCD study of Fe3O4/GaAs interface

Authors
Publication date
1 October 2005
Publisher
Doi

    Abstract

    Ultrathin Fe oxide films of various thicknesses prepared by post-growth oxidation on GaAs(100) surface have been investigated with X-ray photoelectron spectroscopy (NPS), X-ray absorption spectroscopy (XAS), and X-ray magnetic circular dichroism (XMCD). The XPS confirms that the surfaces of the oxide are Fe3O4 rather than Fe2O3. XAS and XMCD measurements indicate the presence of nsulating Fe divalent oxide phases (FeO) beneath the surface Fe-3 O-4 layer with the sample thickness above 4 mn. This FeO might act as a barrier for the spin injection into the GaAs

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      This paper was published in White Rose Research Online.

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