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Secondary Ion Mass Spectrometry Characterization of IrO2-Ta2O5 Thin Films: Effect of Relative Composition on Electrode Properties

By S. DAOLIO, A. DE BATTISTI, M. FABRIZIO, L. NANNI and C. PICCIRILLO

Abstract

IrO2 and Ta2O5 mixed oxide coatings were deposited on Ti supports in order to fabricate dimensionally stable electrodes used in chloro-alkali technology. Secondary ion mass spectrometry (SIMS) and electrochemical experiments were carried out in order to characterize these materials. Electrochemical tests found the highest electrocatalytic activity for 50% IrO2–50% Ta2O5 electrodes. SIMS analyses are in\ud harmony with these results, and it is shown that IrO2 is more diluted on the surface for noble metal oxide concentrations higher than 50%. Finally, it was observed by SIMS that support material migration was favoured at the highest concentrations of Ta2O5 stabilizer

Year: 1998
OAI identifier: oai:iris.unife.it:11392/1200746
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