Article thumbnail
Location of Repository

Correlation Between Kink Effect and Hot-Carrier Induced Degradation in Polysilicon Thin-Film Transistors

By G. Fortunato, L. Mariucci, F. Massussi, A. Pecora, F. Plais, D. Pribat, L. Colalongo and M. Valdinoci
Year: 1997
OAI identifier: oai:iris.unibs.it:11379/160569
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://hdl.handle.net/11379/16... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.