The surface morphology and growth behavior of fullerene thin films have been studied by atomic force microscopy and height difference correlation function analysis. In contrast to the large growth exponents (beta) previously reported for other organic semiconductor thin-film materials, a relatively small beta value of 0.39±0.10 was determined. Simulations of (1+1)-dimensional surface lateral diffusion models indicate that the evolution of deep grain boundaries leads to a rapid increase in beta. We suggest that the commonly observed large beta values for organic thin films are due to their intrinsically anisotropic molecular structures and hence different stacking directions between crystallite domains
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