Location of Repository

Growth dynamics of C60 thin films: effect of molecular structure

By S. Yim and T. S. (Tim S.) Jones

Abstract

The surface morphology and growth behavior of fullerene thin films have been studied by atomic force microscopy and height difference correlation function analysis. In contrast to the large growth exponents (beta) previously reported for other organic semiconductor thin-film materials, a relatively small beta value of 0.39±0.10 was determined. Simulations of (1+1)-dimensional surface lateral diffusion models indicate that the evolution of deep grain boundaries leads to a rapid increase in beta. We suggest that the commonly observed large beta values for organic thin films are due to their intrinsically anisotropic molecular structures and hence different stacking directions between crystallite domains

Topics: QD
Publisher: American Institute of Physics
Year: 2009
OAI identifier: oai:wrap.warwick.ac.uk:945

Suggested articles

Preview


To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.