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Multiple-crystal X-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal

By Z. W. Hu, Pam A. Thomas, Mool C. Gupta and William Paul Risk

Abstract

A periodically domain-inverted KTiOPO4 crystal has been characterized for the first time by multiple-crystal multiple-reflection x-ray topography. The striation contrast within the domain- inverted regions has been revealed in high strain-sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4 are discussed in terms of the structural characteristics of KTiOPO4

Topics: TK, QC
Publisher: American Institute of Physics
Year: 1995
OAI identifier: oai:wrap.warwick.ac.uk:1032

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