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p-type delta-doped layers in silicon: structural and electronic properties

By Nevil L. Mattey, M. G. Dowsett, Evan H. C. Parker, Terry E. Whall, S. (Stephen) Taylor and J. F. Zhang

Abstract

We report on the properties of p-type delta-doped layers prepared in molecular beam epitaxy-Si by growth interruption and evaporation of elemental B. Secondary-ion mass spectrometry measurements at several primary ion energies have been used to show that the full width at half maximum is ~2 nm. Hall measurements confirm that the layers are completely activated at 300 K with a mobility of 30±5 cm2/V s for a carrier density of (9±2)×1012 cm−2. At temperatures below 70 K nonmetallic behavior is observed which we have attributed to conduction between impurity states. It is concluded that the critical acceptor separation for the Mott metal-insulator transition in this system is significantly less than the value found in uniformly doped Si:B

Topics: TK, QC
Publisher: American Institute of Physics
Year: 1990
OAI identifier: oai:wrap.warwick.ac.uk:1042

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