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Mesure de l'ionisation en fonction du champ electrique dans le tetramethylsilane (tms)

By A.G. Daba
Topics: [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]
Publisher: HAL CCSD
Year: 1992
OAI identifier: oai:HAL:in2p3-00020951v1
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