New parameter extraction method based on split C-V measurements in FDSOI MOSFETs

Ben Akkez, I.; Cros, A.; Fenouillet-Beranger, C.; Boeuf, F.; Rafhay, Q.; Balestra, F.; Ghibaudo, G.

oai:HAL:hal-01002112v1

New parameter extraction method based on split C-V measurements in FDSOI MOSFETs

Authors: I. Ben Akkez
A. Cros
C. Fenouillet-Beranger
F. Boeuf
Q. Rafhay
F. Balestra
G. Ghibaudo
Publication date: June 1, 2013
Publisher: 'Elsevier BV'
Doi: DOI:10.1016/j.sse.2013.02.011

Abstract

International audienceVol. 84, pp., doi:(June 2013

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oai:HAL:hal-01002112v1Last time updated on 11/9/2016

This paper was published in HAL Université de Savoie.

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