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Polarized Raman spectroscopy of v-SiO2 under rare-gas compression

By Coralie WEIGEL, Marie Foret, Bernard HEHLEN, Mathieu Kint, Sebastien CLEMENT, Alain Polian, Rene VACHER and Benoit Ruffle

Abstract

International audienceHigh-pressure polarized Raman spectra of vitreous silica are measured up to 8 GPa in a diamond-anvil cell atroom temperature. The combined use of either a nonpenetrating pressurizing medium—argon—or a penetrating one—helium, allows one to separate density from stress effects on the Raman frequencies. In the framework of a simple central force model, the results emphasize the distinct role played by the shrinkage of the intertetrahedral angle Si-O-Si and the force-constant stiffening during the compression. The polarization analysis further reveals the existence of an additional isotropic component in the high-frequency wing of the boson peak. The pressure dependence of the genuine boson peak frequency is found to be much weaker than previously reported and even goes through a minimum around 2 GPa in remarkable coincidence with the anomalous compressibility maximum of silica

Topics: [ PHYS.COND.CM-MS ] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]
Publisher: American Physical Society
Year: 2016
DOI identifier: 10.1103/PhysRevB.93.224303
OAI identifier: oai:HAL:hal-01337959v1
Provided by: Hal-Diderot
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