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Optical quality ZnSe films on silicon for mid-IR waveguides

By Vinita Mittal, James Wilkinson and Ganapathy Senthil Murugan

Abstract

ZnSe films were deposited on silicon substrates by evaporation and RF-sputtering and compared for their structural, morphological and optical properties. The deposited films were tested as waveguide cladding and the evaporated films showed lower loss

OAI identifier: oai:eprints.soton.ac.uk:392993
Provided by: e-Prints Soton
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