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Análise da influência da temperatura no auto-teste de circuitos analógicos : método baseado em osciladores

By Fabiano Toson, Erika Fernandes Cota, Luigi Carro and Marcelo Soares Lubaszewski
Topics: Engenharia elétrica, Engenharia Elétrica I, Engenharias
Year: 2013
OAI identifier: oai:agregador.ibict.br.PC_UFRGS:oai:www.lume.ufrgs.br:10183/81733
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