oaioai:invenio.nusl.cz:221852

Measurement of spectral characteristics in Labview environment

Authors
Publication date
1 January 2008
Publisher
Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií

Abstract

This work deals with design of a program for measurement of characteristics luminescence of inorganic semiconductors in LabView environment. After understanding with theoretic part a program for automated measurements was made including two type of measurements option. The program for measurement of Volt-Ampere characteristics by given wave length and for measurement of current on wave length dependencies is presented

Similar works

Full text

thumbnail-image

National Repository of Grey Literature

redirect
oaioai:invenio.nusl.cz:221852
Last time updated on 10/08/2016

This paper was published in National Repository of Grey Literature.

Having an issue?

Is data on this page outdated, violates copyrights or anything else? Report the problem now and we will take corresponding actions after reviewing your request.