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Measurement of spectral characteristics in Labview environment

By Dávid Konečný

Abstract

This work deals with design of a program for measurement of characteristics luminescence of inorganic semiconductors in LabView environment. After understanding with theoretic part a program for automated measurements was made including two type of measurements option. The program for measurement of Volt-Ampere characteristics by given wave length and for measurement of current on wave length dependencies is presented

Topics: LabView; luminescence; photoconductance; organic semiconductor
Publisher: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Year: 2008
OAI identifier: oai:invenio.nusl.cz:221852
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