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Laboratory test equipment for IGBT transistors

By Pavel Chvátlina


This master’s thesis describes the function and realization of the laboratory test equipment designed for measuring and analysing of collector current iC and voltage uCE courses during the opening and closing process of a power IGBT transistor. The opening and closing times toff and ton of the new power transistor IGBT are changing in the range from tenths to the ones s, so the reading of current iC and voltage uCE proceeds in a very short time. The measuring circuit of this test equipment is based on a short-time discharging of a condenser battery to the inductive load over the measured transistor. Consequently it is possible to replace the power supply whose maximum output power would otherwise have to be in the range of ones MW. In the final part of this thesis there are described properties and design of a high-frequency sensor with the Rogowski coil, which can be used for reading collector current course during opening and closing time of the measured transistor IGBT. Collector current iC and voltage uCE courses can be analysed with a storage oscilloscope

Topics: opening process; IGBT transistor; Rogowski coil; closing process; vypínací děj; drive circuit; voltage multiplier; násobič napětí; Rogowského cívka; budicí obvod; tranzistor IGBT; zapínací děj
Publisher: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Year: 2009
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