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MEASURING SYSTEMS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS AND CONCEPT OF «A PRIORI INFORMATION ELIMINATION»

By V. L. Kozlov and M. M. Kygeiko

Abstract

Construction principles of highly effective measuring systems based on two-wavelength semiconductor lasers and the concept «a priori information elimination» are presented. These systems provide advantages before similar one-wavelength laser measuring instruments

Topics: двухволновой полупроводниковый лазер, концепция «безаприорности», лазерные измерительные системы, Engineering (General). Civil engineering (General), TA1-2040
Publisher: Belarusian National Technical University
Year: 2012
OAI identifier: oai:doaj.org/article:51c1249613374f3bb5ee1891f566909e
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