MEASURING SYSTEMS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS AND CONCEPT OF «A PRIORI INFORMATION ELIMINATION»
Abstract
Construction principles of highly effective measuring systems based on two-wavelength semiconductor lasers and the concept «a priori information elimination» are presented. These systems provide advantages before similar one-wavelength laser measuring instrumentsSimilar works
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Last time updated on 09/08/2016
This paper was published in Directory of Open Access Journals.
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