Skip to main content
Article thumbnail
Location of Repository

A comparative study on march tests for SRAMS

By Mrs. Princy.P and Dr. N.M Sivamangai

Abstract

SRAMs are widely used in cache memories due to its infinite and very fast read/write operations. The ever increasing density of embedded memories on SoC’s (System on Chips) gives rise to many defects and faults which cannot be identified during the fabrication process. The advantages of March tests for fault\ud detection which make it acceptable for industries includes simplicity, high fault coverage and the linearity of test time with memory size.. High reliability is a major concern for memories if they are a part of control units implemented in hazardous environments. Even the occurrence of a single fault may lead to disasters.This emphasizes the importance of comparing and evaluating existing March tests considering all types of faults. All\ud the traditional tests concentrates on the probability of occurrence of a fault rather than its mere occurrence This paper analysis the various types of faults in SRAMs(Static Random Access Memories), evaluates various dedicated March tests considering the percentage of fault detection.\u

Topics: - SRAMs, static dynamic coupled, March tests, Engineering (General). Civil engineering (General), TA1-2040, Technology, T
Publisher: American Journal of Engineering Research
Year: 2016
OAI identifier: oai:doaj.org/article:9f02e7fe551c433fa71f5b658bfc2300
Journal:
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • https://doaj.org/toc/2320-0847 (external link)
  • https://doaj.org/toc/2320-0936 (external link)
  • http://www.ajer.org/papers/v3(... (external link)
  • https://doaj.org/article/9f02e... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.