The work covers the development of atom-emissive method for spectrum analysis on the basis of classic representation of processes in low-temperature plasma; elaboration of algorithms, procedures and software for proximate analysis during production process. A method of mateirals srectrum proximate analysis has been developed and studied that allow to improve reliability, accuracy and efficiency of photographic and photoelectric analysis methods, to decrease the number of the standards under usage on the basis of the firstly utilized combined parameter alpha chi . The developed algorithms, procedures and software for photographic and photoelectric proximate analysis allow to automate the processing of the analysis results. The accuracy of the developed method is 10 to 15% higher than those having been used earlier. The number of standards to be used and the duration of the proximate analysis has been decreased 4 to 5 timesAvailable from VNTIC / VNTIC - Scientific & Technical Information Centre of RussiaSIGLERURussian Federatio
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