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Investigation and development of methods for increasing quality and reliability control efficiency at integrated microcircuit production

By Golubev Vladimir Vladimirovich

Abstract

The work is concerned with the quality and reliability control system at enterprises of electronic industry. The aim is to develop the complex of methods on the efficiency, quality control and reliability at microcircuit production on base of studying and using information accumulated over many enterprises and microcircuit types about the type spectrum and mechanisms of their faults. The most important parameters of technological operations according to the degree of their influence on the microcircuit (IC) reliability have been determined, the model of early IC faults and on its base the method of electric heat-training and operationad control reliability optimization, and also the method of test acceleration coefficient evaluation on the base of taking fault mechanizm spectrum into consideration have been developed. The method complex permitting to optimize the production process control, duration of electric heat-training and test volume for reliability and also to calculate the forced test acceleration coefficient has been created. The requirements of production process control, methods of electric heat-training optimization and method of accelertated reability tests have been included into the branch standards. The quantity of microcircuit reclamations was decreased 3-5 timesAvailable from VNTIC / VNTIC - Scientific & Technical Information Centre of RussiaSIGLERURussian Federatio

Topics: 09C - Electronic devices, electromechanical devices, ELECTRONICS. RADIO ENGINEERING,GENERAL AND COMPLEX PROBLEMS OF TECHNICAL AND APPLIED SCIENCES AND BRANCHES OF NATIONAL ECONOMY
Year: 1992
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Provided by: OpenGrey Repository
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