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Etude critique de l'analyse des structures fines observees en SEELFS: application au seuil M_2_3 du nickel face (111)

By Mohammed Rjeb

Abstract

SIGLEINIST T 75066 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc

Topics: 20K - Solid-state physics
Year: 1990
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Provided by: OpenGrey Repository
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