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Holografische Mess- und Pruefsysteme - Grundlagen fuer anwendungsorientierte und industriereife optische Messsysteme Schlussbericht

By M. Reichle, B. Meyer, I. Thomas, B. Maehner, Muenchen (Germany) M.A.N. Technologie G.m.b.H. and Bonn (Germany) Bundesministerium fuer Forschung und Technologie (BMFT)

Abstract

With 8 refs., 9 tabs., 63 figs.SIGLEAvailable from TIB Hannover: FR 6117 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekDEGerman

Topics: 14B - Laboratories, test facilities, test equipment
Year: 1991
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Provided by: OpenGrey Repository
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