Two scanning electron microscopy (SEM) electron–specimen interactions that provide images based on sample\ud crystal structure, electron channelling and electron backscattered diffraction, are described. The SEM operating\ud conditions and sample preparation are presented, followed by an example application of these techniques to the study\ud of pyritised plant material. The two approaches provide an opportunity to examine simultaneously, at higher\ud magnifications normally available optically, detailed specimen anatomy and preservation state. Our investigation\ud suggests that whereas both techniques have their advantages, the electron channelling approach is generally more\ud readily available to most SEM users. However, electron backscattered diffraction does afford the opportunity of\ud automated examination and characterisation of pyritised fossil material
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