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Critical EPR line broadening in the double-layer antiferromagnet K3Mn2F7

By C.M.J. Uijen and H.W. de Wijn

Abstract

The divergence of the EPR linewidth of Mn2+ in K3Mn2F7 when approaching TN = 58.3 K has been measured at 25 GHz for magnetic fields parallel and perpendicular to the easy axis. The critical exponent p is in accord with the relation p = (3 - 2η)v for critical coefficients of 2D systems

Topics: Natuur- en Sterrenkunde
Year: 1980
OAI identifier: oai:dspace.library.uu.nl:1874/24850
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