10.1016/j.ijms.2008.03.008

Possibility of nano-local element analysis by near-field laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS): New experimental arrangement and first application

Abstract

A near-field laser ablation inductively coupled plasma mass spectrometric (NF-LA-ICP-MS) procedure was created for element analysis in the nm resolution range. The method utilizes a well-known near-field effect in order to enhance the incident light energy on the thin tip of a Ag needle during the laser ablation process. A robust needle etching procedure was developed to produce the thin needles with a tip diameter in the range of hundreds of nm. An experimental arrangement was constructed to control the "sample-to-tip" distance via the measurements of tunnel current between the needle and sample surface. The NF-LA-ICP-MS technique thus developed was applied to analyze thin Au films deposited onto a Si substrate. The observed craters ranged from 500 nm to about 1 mu m in diameter and were dependent on the needle used as well as on the "sample-to-tip" distance. These results were also confirmed by mass spectrometric measurements of the Au sample. Theoretical calculations performed showed that using the developed NF-LA-ICP-MS arrangement a detection efficiency of 2.7 x 10(-5) cps per ablated Au atom can be achieved. (C) 2008 Elsevier B.V. All rights reserved

Similar works

Full text

thumbnail-image

Juelich Shared Electronic Resources

Full text is not available
oai:juser.fz-juelich.de:61965Last time updated on 5/16/2016

This paper was published in Juelich Shared Electronic Resources.

Having an issue?

Is data on this page outdated, violates copyrights or anything else? Report the problem now and we will take corresponding actions after reviewing your request.