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Dependence of the electronic transport on the microstructure in annealed Bi thin films.

By Sébastien Faniel, Frederico Rodrigues Martins, Vincent Bayot, Benoît Hackens, L. Desplanque, X. Wallart, B. Rosenow and APS March Meeting
Year: 2013
OAI identifier: oai:dial.uclouvain.be:boreal:135515
Provided by: DIAL UCLouvain
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