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Dependence of the electronic transport on the microstructure in annealed Bi thin films.

By Sébastien Faniel, Frederico Rodrigues Martins, Vincent Bayot, Benoît Hackens, L. Desplanque, X. Wallart, B. Rosenow and APS March Meeting
Year: 2013
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Provided by: DIAL UCLouvain
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