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White noise in MOS transistors and resistors

By Rahul Sarpeshkar, Tobias Delbrück and Carver A. Mead

Abstract

The theoretical and experimental results for white noise in the low-power subthreshold region of operation of an MOS transistor are discussed. It is shown that the measurements are consistent with the theoretical predictions. Measurements of noise in photoreceptors-circuits containing a photodiode and an MOS transistor-that are consistent with theory are reported. The photoreceptor noise measurements illustrate the intimate connection of the equipartition theorem of statistical mechanics with noise calculations

Publisher: IEEE
Year: 1993
OAI identifier: oai:authors.library.caltech.edu:53119
Provided by: Caltech Authors

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