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A simple approach of determination of the crystallographic orientation: Applications and accuracy

By S.C. Wang and M.J. Starink

Abstract

A simple analytical solution for the crystallographic orientation is described. This method is based on one indexed Kikuchi pair in a known zone rather than the corresponding diffraction spots. The accuracy of this method is shown to be better than 0.1° even for cases in which a zone axis deviates by a large angle (e.g. 10°) from the centre of the beam direction. This approach simplifies experiments beacuse only one pair of Kikuchi lines and a zone axis are needed, and is especially suited when it is difficult or cumbersome to resolve a second pair of Kikuchi lines with sufficient accuracy

Topics: TA
Year: 2003
OAI identifier: oai:eprints.soton.ac.uk:22463
Provided by: e-Prints Soton

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