To further develop grain-textured YBCO thin films for conductor development, we deposited, via a fluorine-free sol-gel synthesis, YBCO thin films on non-textured silver substrate. The interface structures were studied by both x-ray diffraction (XRD) and transmission electron microscopy (HRTEM). XRD data indicated that the YBCO films on silver substrate exhibited c-axis grain orientations. Experimental details are reported on the sol-gel synthesis chemistry and XRD and HRTEM characterization of the YBCO thin films. © 2002 American Institute of Physics
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