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Infrared Electronic speckle pattern interferometry at 10 µm

By Jean-François Vandenrijt and Marc Georges

Abstract

Demonstration of electronic speckle pattern interferometry of opaque scattering objects at 10 µm wavelength using a commercial thermal-camera is presented for the first time to our knowledge. The idea of using a wavelength longer than the usual visible ones is to render such holographic displacement measurement techniques less sensitive to external perturbations. We have observed the rotation of a metallic plate and applied the phase-shifting technique for quantitative measurementsPeer reviewe

Topics: electronic speckle pattern interferometry, infrared, Physical, chemical, mathematical & earth Sciences :: Physics, Physique, chimie, mathématiques & sciences de la terre :: Physique
Year: 2007
OAI identifier: oai:orbi.ulg.ac.be:2268/8259
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