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Depth profiling of modified PVC surfaces using confocal Raman microspectroscopy

By J. Sacristan, C. Mijangos, H. Reinecke, S. J. Spells and J. Yarwood

Abstract

Depth profiles of poly(vinyl chloride) (PVC) films chemically modified in solvent/non-solvent mixtures were obtained using confocal Raman microscopy (CRM). The non-destructive technique allows the characterization of interphases of up to 50 microns in thickness with a resolution of 1.4 mu m. The accuracy of CRM is demonstrated by comparison of mean degrees of modification calculated from depth profiles and values obtained by transmission FTIR spectroscopy

Publisher: John Wiley & Sons
Year: 2000
DOI identifier: 10.1002/1521-3927(20000801)21:13<894::aid-marc894>3.0.co;2-1
OAI identifier: oai:shura.shu.ac.uk:1476
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