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Evaluation of Low Dose Rate Sensitivity in Discrete Bipolar Junction Transistors

Abstract

We evaluate the low dose rate sensitivity in several families of discrete bipolar transistors across device parameter, quality assurance level, and irradiation bias configuration. We discuss the implications of the results for radiation hardness assuranc

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NASA Technical Reports ServerProvided a free PDF (195.62 KB)

20120008350oai:casi.ntrs.nasa.gov:20120008350
Last time updated on March 28, 2020View original full text link

This paper was published in NASA Technical Reports Server.

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