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High Throughput In Situ XAFS Screening of Catalysts

By Nikolaos Tsapatsaris, Angela M. Beesley, Norbert Weiher, Helen Tatton, Andy J. Dent, Frederick J.W. Mosselmans, Moniek Tromp, Sergio Russu, John Evans, Ian Harvey, Shu Hayama and Sven L.M. Schroeder


We outline and demonstrate the feasibility of high-throughput (HT) in situ XAFS for synchrotron radiation studies. An XAS data acquisition and control system for the analysis of dynamic materials libraries under control of temperature and gaseous environments has been developed. The system is compatible with the 96-well industry standard and coupled to multi-stream quadrupole mass spectrometry (QMS) analysis of reactor effluents. An automated analytical workflow generates data quickly compared to traditional individual spectrum acquisition and analyses them in quasi-real time using an HT data analysis tool based on IFFEFIT. The system was used for the automated characterization of a library of 91 catalyst precursors containing ternary combinations of Cu, Pt, and Au on ?-Al2O3, and for the in situ characterization of Au catalysts supported on Al2O3 and TiO2

Topics: QD, QC
Publisher: American Institute of Physics
Year: 2007
OAI identifier:
Provided by: e-Prints Soton

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